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Materials and Device Characterization

  Materials and Device Characterization
  We offer access to a wide range of characterization techniques for materials and devices; optic microscopy, high resolution scanning and transmission electron microscopy, x-ray diffraction, scanning probe techniques and a variety of electric, optic and magnetic characterization of materials, structures and devices.
 
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(Extract from LIMS)
 
 NameManufacturerModel
DetailsHR X-RayX-RayX-Ray
DetailsM11 Nikon/CD 1NikonOPTISHOT/Linjebreddsmätare
DetailsM05 Nikon/autoNikonMicroscope
DetailsM10 Nikon/autoNikonMicroscope (motorized objectives)
DetailsProbestation 1 ManualCascade11000
DetailsManual probstationSuss Microtech10500006 (probe station)
DetailsAFM/SSRMVeeco/Digital InstrumentsNanoScope Dimension 3100
DetailsProbestation 3 Semi AutomaticCascade MicrotechCascade 12000
DetailsUVISEL Spectroscopic EllipsometryHORIBAUVISEL ER
DetailsProbestation 4 High Temp.SignatoneS-1060
DetailsEmpyreanPANalytical B.V.Empyrean multipurpose high resolution X-ray diffra
DetailsSR2000N Sheet ResistanceMDCSR2000N
DetailsLabRamHR Raman/mikro-PL-systemHoribaLabRamHR
DetailsBergman Labora Inspection MicroscopeNikonL
DetailsBergman Labora NIS-ComputerIntelIntel Xeon 2245 3.9GHz, Nvidia Quadro RTX5000 8GB
DetailsSpintronics probestationcustom built Probestation with rotating 1 T electromagnet
DetailsDektakXT Stylus ProfilometerBrukerDektakXT
DetailsTesttool ElectrumElectrum labmodel 1
DetailsM14 Olympus/cameraOlympusBX60
DetailsM13 Nikon/cameraNikonNikon
DetailsMS02 NikonNikonStereo microscope SMZ-2T
DetailsM08 Leitz/cameraLeitzMicroscope with camera
DetailsM09 Nikon/cameraNikonMicrosocpe with camera
DetailsMS01 NikonNikonStereo microscope SMZ-2B
DetailsSkivthkMitutoyoRDP transducer indicator E307-1
DetailsOptical profilometerVeecoWyko NT9300
DetailsCanon EOS 350DCanonEOS 350D 100mm Macro
DetailsBond Tester DAGEDAGE2400PC
DetailsMicrowave/THz Probe StationMSTMST Lab
DetailsZVA-24 Vector Network AnalyzerMSTMST Lab
DetailsTheta LiteMSTMST lab
DetailsKeithley ParameteranalyserTektronix4200A-SCS
DetailsDynatronix Pulse Power SupplyDynatronixDuPR10-.1-.3XR
DetailsPXINational InstrumentsNI PXI-1033 Series
DetailsTable-top SEMSECSNE Alpha
DetailsTable-top sample sputterSECMCM-100
DetailsRF Probe StationMSTMST Lab
DetailsAtomic Absorption SpectrometerThermco FisherThermo iCE 3000
DetailsKemvåg??
DetailsAFM/SPM CellKraft Humidifier AlbanovaCellKraftP2
DetailsAFM/SPM IPS Bipotentiostat AlbanovaIPSPGU-BI 1000
DetailsFIB/SEM AlbanovaFEI CompanyNova 200
DetailsProfiler AlbanovaKLA-TencorP7
DetailsEvercool PPMS AlbanovaQuantum DesignEvercool II
DetailsHelios 5 UC FIB/SEM AlbanovaFEIHelios 5 UC
DetailsFTIR AlbanovaThermofischernicolet iS 50 FT-IR
DetailsDynaCool PPMS AlbanovaQuantum DesignDynacool
DetailsWoollam VASE AlbanovaJ.A. WoollamVASE Ellipsometer
DetailsSPM/AFM FastScan AlbanovaBrukerDimension FastScan
DetailsSPM/AFM Nanowizard JPK AlbanovaJPK InstrumentsNanowizard 3 Bioscience AFM
DetailsSPM/AFM Icon AlbanovaBrukerDimension Icon
DetailsOpt. micr. 1, AlbanovaNikonME600
DetailsOpt. micr. 2, AlbanovaNikonME600
DetailsOpt. micr. 3, AlbanovaNikonEclipse L200
DetailsOpt. micr. 4, fluorescence, AlbanovaNikonME600 w. fluorescence unit
DetailsAFM/SPM Nanow.JPK2 AlbanovaJPK InstrumentsNanowizard 3
DetailsCnCVSEMILAB210
DetailsPrometeus autoKarl Suss and Temptronic TermoChuck SystemAutomatic Probestation PA 150 and TP03215B-3300-2
DetailsHallVarian/KeithlyIn-house
DetailsAGMPrinceton Measurement Corporation2900-02 Alternating Gradient Magnetometer
Details3D MF ProbestationIn-houseMedium Field MR and RF Probe Station
DetailsHF ProbestationIn-houseHigh Field RF Characterization Station
DetailsCIPTSmartipCIPTech
DetailsVT STMOmicronOmicron VT-STM
DetailsSTM 1OmicronOmicron STM-1
DetailsUHV SPM 3500RHK TechnologyUHV SPM 3500
DetailsRaman Spectrometer HORIBA iHR 550HORIBA Jobin YvoniHR 550
DetailsUEMJEOL JEM-2100Ultrafast Electron Microscopy
DetailsScanning near-field optical microscope (SNOM)Max Born Institute with modifications at KTHA home-made instrument
DetailsGeminiZeiss Ultra 55
DetailsPlasma cleanerFischionePlasma cleaner
DetailsGold sputter FNMJEOLIon sputter JFC-1100
DetailsDiamond sawBuehlerIsomet low speed saw
DetailsGrinder-polisherBuehlerVector/Alpha
DetailsUltrasonic disc cutterGatanModel 601
DetailsDimple grinderGatanDimple grinder
DetailsElectrolyte polishingFischioneElectrolyte polishing
DetailsIon polishingGatanPrecision ion polishing 691
DetailsM20 MicroscopeNanometricsMicroscope
DetailsLaboratory ovenHereausBench oven
DetailsFreeze DryerIlshin LabIlshin
DetailsDifferential scanning calorimetry (DSC)TA Instruments2920 modulated DSC
DetailsParticle sizer-DLS/Zeta potentialBeckman CoulterDelsa Nano
DetailsThermogravimetry Analysis (TGA)TA InstrumentsTGA Q500
DetailsUV-Vis-NIR SpectrometerPerkin ElmerLambda-750
DetailsFluorescence Spectrometer (PL)Perkin ElmerLS55
DetailsRotational ViscometerAnton PaarVisco QC 100
DetailsFourier Transform Infrared (FTIR)Thermo ScientificNicolet iS10
DetailsInductively Coupled Plasma Emission Spectrometry (ICP-OES)Thermo ScientificiCAP 6500
DetailsIon Chromatography (IC)MetrohmEco IC
DetailsPotentiostat / Galvanostat - ZRAGAMRY InstrumentsVistsShield/Interface 1010
DetailsGas Gromatography /Mass Spectrometry (GC/MS)Hewlett PackardHP 6890
DetailsCentrifuge Z 200 AHERMLEZ 200 A
DetailsTwo speed grinder-polisherBUEHLERAlpha
DetailsPrecision ion polishing systemGatanmodel 691
DetailsMulti vessel dip coating unitAoxicindiaXdip.MVI
DetailsRotavapor BÜCHIR-205
DetailsOptical microscope (Leica)LEICA DMLMLeica
DetailsTGA/FTIR InterfaceThermo Scientific--
DetailsPreparation labCollection of toolsTools for sample preparation
DetailsFE-TEMJEOLJEM 2100F(HR), JEOL Electron Microscope 2100 Field
DetailsFIB-SEMFEIQUANTA 3D FEG
DetailsWafer Inspection SystemAeronca Electronics (Ceased), EstekWIS150
DetailsEDSHitachiSU8230
DetailsFrejaHitachiSU8230
DetailsCryogenic ProbestationJanisST-500-UHT
DetailsFTIR SpectrometerBrukerVortex 70 V
DetailsPrometeus manualKarl Suss and Temptronic TermoChuck SystemManual Probestation PM 5, TP0314A
DetailsDektakSTDektak3ST
DetailsM07 Olympus/cameraOlympusMicroscope
DetailsM02 Olympus/cameraOlympusBX60
DetailsM03 LeicaLeicaMicroscope
DetailsUVO CleanerJelight COmpany, Inc42-220
DetailsLEITZLEITZ MPV-SPThin film interferometry,
DetailsM01 OlympusOlympusBX60M
Details4-PointFour Dimensions, IncModel 280
DetailsCD SEMHitachiS-3400N & EDS QUANTAX 200

 

2020-06-30 Quality group (P)